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Effect of a rapid thermal annealing process on the electrical properties of an aluminum-doped indium zinc tin oxide thin film transistor

Nam, Yunyong; Yang, Jong-Heon; Jeong, Pilseong; Kwon, Oh-Sang; Pi, Jae-Eun; Cho, Sung Haeng; Hwang, Chi-Sun; et al, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.214, no.1, 2017-01

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