Search
Results 1761-1770 of 2075 (Search time: 0.01 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Sparse HDLSS discrimination with constrained data piling Ahn, Jeongyoun; Jeon, Yongho, COMPUTATIONAL STATISTICS & DATA ANALYSIS, v.90, pp.74 - 83, 2015-10 | |
| On the number of principal components in high dimensions Jung, Sungkyu; Lee, Myung Hee; Ahn, Jeongyoun, BIOMETRIKA, v.105, no.2, pp.389 - 402, 2018-06 | |
| General sparse multi-class linear discriminant analysis Safo, Sandra E.; Ahn, Jeongyoun, COMPUTATIONAL STATISTICS & DATA ANALYSIS, v.99, pp.81 - 90, 2016-07 | |
| A Nonparametric Kernel Approach to Interval-Valued Data Analysis Jeon, Yongho; Ahn, Jeongyoun; Park, Cheolwoo, TECHNOMETRICS, v.57, no.4, pp.566 - 575, 2015-10 | |
| Clustering Multivariate Functional Data with Phase Variation Park, Juhyun; Ahn, Jeongyoun, BIOMETRICS, v.73, no.1, pp.324 - 333, 2017-03 | |
| Quantitative representation of the functional resonance analysis method for risk assessment Kim, Yoo Chan; Yoon, Wan Chul, RELIABILITY ENGINEERING & SYSTEM SAFETY, v.214, 2021-10 | |
| Ergonomic postural assessment using a new open-source human pose estimation technology (OpenPose) Kim, Woojoo; Sung, Jaeho; Saakes, Daniel Pieter; Huang, Chunxi; Xiong, Shuping, INTERNATIONAL JOURNAL OF INDUSTRIAL ERGONOMICS, v.84, pp.103164, 2021-07 | |
| Wafer Delay Analysis and Workload Balancing of Parallel Chambers for Dual-Armed Cluster Tools With Multiple Wafer Types Ko, Sung-Gil; Yu, Tae-Sun; Lee, Tae-Eog, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.18, no.3, pp.1516 - 1526, 2021-07 | |
| Bayesian variable selection in clustering high-dimensional data via a mixture of finite mixtures Doo, Woojin; Kim, Heeyoung, JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, v.91, no.12, pp.2551 - 2568, 2021-08 | |
| A Bayesian nonparametric mixture measurement error model with application to spatial density estimation using mobile positioning data with multi-accuracy and multi-coverage Lee, Youngmin; Jeong, Taewon; Kim, Heeyoung, TECHNOMETRICS, v.62, no.2, pp.173 - 183, 2020-04 |
Discover
Open Access
- 55 OA Article