Results 21-22 of 22 (Search time: 0.002 seconds).
|NO||Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)|
|21||Efficient VaR and CVaR Measurement via Stochastic Kriging|
Chen, Xi; Kim, Kyoung-Kukresearcher, INFORMS JOURNAL ON COMPUTING, v.28, no.4, pp.629 - 644, 2016-09
|22||Controlled Wafer Release in Clustered Photolithography Tools: Flexible Flow Line Job Release Scheduling and an LMOLP Heuristic|
Park, Kyungsu; Morrison, James Rresearcher, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.12, no.2, pp.642 - 655, 2015-04