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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Journal Papers(저널논문)

광반사율을 이용한 GaAs:Si의 띠 간격측정

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이희철researcher / 이철 / 이남영 / 김재은researcher / 박해용researcher / 곽동화
Publisher
한국물리학회
Issue Date
1994-10
Language
Korean
Citation

새물리, v.34, no.5, pp.562 - 566

ISSN
0374-4914
URI
http://hdl.handle.net/10203/60885
Appears in Collection
EE-Journal Papers(저널논문)PH-Journal Papers(저널논문)
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