Graphic Comparison of Three-State Device Redundancies
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Kyung Soo | ko |
| dc.date.accessioned | 2013-02-25T04:47:28Z | - |
| dc.date.available | 2013-02-25T04:47:28Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | MICROELECTRONICS RELIABILITY, v.24, no.3, pp.461 - 464 | - |
| dc.identifier.issn | 0026-2714 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/59967 | - |
| dc.language | English | - |
| dc.publisher | Pergamon-Elsevier Science Ltd | - |
| dc.title | Graphic Comparison of Three-State Device Redundancies | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1984TB64900017 | - |
| dc.identifier.scopusid | 2-s2.0-0021312177 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 24 | - |
| dc.citation.issue | 3 | - |
| dc.citation.beginningpage | 461 | - |
| dc.citation.endingpage | 464 | - |
| dc.citation.publicationname | MICROELECTRONICS RELIABILITY | - |
| dc.contributor.localauthor | Park, Kyung Soo | - |
| dc.type.journalArticle | Article | - |
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