DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Kwyro | ko |
dc.contributor.author | AMBERIADIS, K | ko |
dc.contributor.author | VANDERZIEL, A | ko |
dc.date.accessioned | 2013-02-24T15:03:33Z | - |
dc.date.available | 2013-02-24T15:03:33Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1982 | - |
dc.identifier.citation | SOLID-STATE ELECTRONICS, v.25, no.10, pp.999 - 1002 | - |
dc.identifier.issn | 0038-1101 | - |
dc.identifier.uri | http://hdl.handle.net/10203/58088 | - |
dc.language | English | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | EFFECT OF TRAP DISTRIBUTION ON G-R NOISE SPECTRA | - |
dc.type | Article | - |
dc.identifier.wosid | A1982PN09400006 | - |
dc.identifier.scopusid | 2-s2.0-0020190739 | - |
dc.type.rims | ART | - |
dc.citation.volume | 25 | - |
dc.citation.issue | 10 | - |
dc.citation.beginningpage | 999 | - |
dc.citation.endingpage | 1002 | - |
dc.citation.publicationname | SOLID-STATE ELECTRONICS | - |
dc.identifier.doi | 10.1016/0038-1101(82)90023-5 | - |
dc.contributor.localauthor | Lee, Kwyro | - |
dc.contributor.nonIdAuthor | AMBERIADIS, K | - |
dc.contributor.nonIdAuthor | VANDERZIEL, A | - |
dc.type.journalArticle | Article | - |
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