SCALABLE SMALL-SIGNAL MODEL FOR BJT SELF-HEATING
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | FOX, RM | ko |
| dc.contributor.author | Lee, Sang-Gug | ko |
| dc.date.accessioned | 2013-02-24T14:38:54Z | - |
| dc.date.available | 2013-02-24T14:38:54Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1991-12 | - |
| dc.identifier.citation | IEEE ELECTRON DEVICE LETTERS, v.12, no.12, pp.649 - 651 | - |
| dc.identifier.issn | 0741-3106 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/57926 | - |
| dc.description.abstract | The effects of self-heating on BJT behavior are demonstrated through measurement and simulation. Most affected are the small-signal parameters Y22 and Y12. A frequency-domain solution to the heat-flow equation is presented that applies to any rectangular emitter geometry. This model, although simple enough for CAD, predicts thermal spreading impedance with good accuracy for a wide range of frequencies. | - |
| dc.language | English | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | SCALABLE SMALL-SIGNAL MODEL FOR BJT SELF-HEATING | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1991GR70600002 | - |
| dc.identifier.scopusid | 2-s2.0-0026395273 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 12 | - |
| dc.citation.issue | 12 | - |
| dc.citation.beginningpage | 649 | - |
| dc.citation.endingpage | 651 | - |
| dc.citation.publicationname | IEEE ELECTRON DEVICE LETTERS | - |
| dc.identifier.doi | 10.1109/55.116943 | - |
| dc.contributor.localauthor | Lee, Sang-Gug | - |
| dc.contributor.nonIdAuthor | FOX, RM | - |
| dc.type.journalArticle | Article | - |
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