DC Field | Value | Language |
---|---|---|
dc.contributor.author | KIM, JH | ko |
dc.contributor.author | Bien, Zeung nam | ko |
dc.date.accessioned | 2013-02-24T14:18:58Z | - |
dc.date.available | 2013-02-24T14:18:58Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1989-08 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.36, no.3, pp.313 - 320 | - |
dc.identifier.issn | 0278-0046 | - |
dc.identifier.uri | http://hdl.handle.net/10203/57791 | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | AN ALGORITHMIC APPROACH TO FAULT-DIAGNOSIS IN LINEAR-SYSTEMS | - |
dc.type | Article | - |
dc.identifier.wosid | A1989AG92900001 | - |
dc.identifier.scopusid | 2-s2.0-0024716666 | - |
dc.type.rims | ART | - |
dc.citation.volume | 36 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 313 | - |
dc.citation.endingpage | 320 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | - |
dc.contributor.localauthor | Bien, Zeung nam | - |
dc.contributor.nonIdAuthor | KIM, JH | - |
dc.type.journalArticle | Article | - |
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