THE VALIDITY OF THE DOUBLE-LAYER MODEL ON THE AMORPHOUS-SEMICONDUCTOR SURFACE INCLUDING THE BULK LOCALIZED STATE WITHIN THE GAP

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Publisher
ELSEVIER SCIENCE BV
Issue Date
1982
Language
English
Article Type
Letter
Citation

JOURNAL OF NON-CRYSTALLINE SOLIDS, v.50, no.1, pp.131 - 135

ISSN
0022-3093
DOI
10.1016/0022-3093(82)90207-1
URI
http://hdl.handle.net/10203/57636
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