A GAAS FLOATED ELECTRON CHANNEL FIELD-EFFECT TRANSISTOR (FECFET) FABRICATED BY SELECTIVE METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION

Cited 9 time in webofscience Cited 9 time in scopus
  • Hit : 344
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorKIM, CTko
dc.contributor.authorHONG, CHko
dc.contributor.authorKwon, Young Seko
dc.date.accessioned2013-02-24T13:12:41Z-
dc.date.available2013-02-24T13:12:41Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1991-12-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.30, no.12B, pp.3828 - 3832-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/10203/57391-
dc.description.abstractWe have proposed and fabricated a new GaAs FET with very short channel, which we call Floated Electron Channel Field Effect Transistor (FECFET), using the Selective Metal Organic Chemical Vapor Deposition (SMOCVD) technique. The channel length of the proposed device is reduced by placing the channel layer on the top of the triangular void. The formation of the triangular void is well characterized by both the growth parameters of the SMOCVD and the mask orientation. The maximum extrinsic transconductance of 260 mS/mm is obtained for the gate length larger than 2-mu-m and the measured source resistance is 0.25-OMEGA.mm. It is also observed that the measured transconductance is almost independent of the gate length when the fabricated gate has a length between 2.0-mu-m and 4.0-mu-m. The effective channel length is mainly determined by the short distance between two n+ layers for source and drain rather than the gate length. This device structure is suitable for low noise FET and for the simple realization of direct coupled FET logic inverter.-
dc.languageEnglish-
dc.publisherJAPAN J APPLIED PHYSICS-
dc.titleA GAAS FLOATED ELECTRON CHANNEL FIELD-EFFECT TRANSISTOR (FECFET) FABRICATED BY SELECTIVE METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION-
dc.typeArticle-
dc.identifier.wosidA1991HF42800060-
dc.type.rimsART-
dc.citation.volume30-
dc.citation.issue12B-
dc.citation.beginningpage3828-
dc.citation.endingpage3832-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS-
dc.identifier.doi10.1143/JJAP.30.3828-
dc.contributor.localauthorKwon, Young Se-
dc.contributor.nonIdAuthorKIM, CT-
dc.contributor.nonIdAuthorHONG, CH-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorSELECTIVE MOCVD-
dc.subject.keywordAuthorFECFET-
dc.subject.keywordAuthorTRIANGULAR VOID-
dc.subject.keywordAuthorMASK ORIENTATION-
dc.subject.keywordAuthorFACET SHAPE-
dc.subject.keywordAuthorDCFL-
dc.subject.keywordPlusLATERAL GROWTH-
dc.subject.keywordPlusLAYERS-
dc.subject.keywordPlusGAS-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 9 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0