A NEW TECHNIQUE FOR CHARACTERIZATION OF THE END RESISTANCE IN MODULATION-DOPED FETS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Kwyro | ko |
| dc.contributor.author | SHUR, MS | ko |
| dc.contributor.author | VALOIS, AJ | ko |
| dc.contributor.author | ROBINSON, GY | ko |
| dc.contributor.author | ZHU, XC | ko |
| dc.contributor.author | VANDERZIEL, A | ko |
| dc.date.accessioned | 2013-02-24T13:11:45Z | - |
| dc.date.available | 2013-02-24T13:11:45Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.31, no.10, pp.1394 - 1398 | - |
| dc.identifier.issn | 0018-9383 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/57387 | - |
| dc.language | English | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | A NEW TECHNIQUE FOR CHARACTERIZATION OF THE END RESISTANCE IN MODULATION-DOPED FETS | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1984TF62500006 | - |
| dc.identifier.scopusid | 2-s2.0-0021501452 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 31 | - |
| dc.citation.issue | 10 | - |
| dc.citation.beginningpage | 1394 | - |
| dc.citation.endingpage | 1398 | - |
| dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
| dc.contributor.localauthor | Lee, Kwyro | - |
| dc.contributor.nonIdAuthor | SHUR, MS | - |
| dc.contributor.nonIdAuthor | VALOIS, AJ | - |
| dc.contributor.nonIdAuthor | ROBINSON, GY | - |
| dc.contributor.nonIdAuthor | ZHU, XC | - |
| dc.contributor.nonIdAuthor | VANDERZIEL, A | - |
| dc.type.journalArticle | Article | - |
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