A NEW TECHNIQUE FOR CHARACTERIZATION OF THE END RESISTANCE IN MODULATION-DOPED FETS

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dc.contributor.authorLee, Kwyroko
dc.contributor.authorSHUR, MSko
dc.contributor.authorVALOIS, AJko
dc.contributor.authorROBINSON, GYko
dc.contributor.authorZHU, XCko
dc.contributor.authorVANDERZIEL, Ako
dc.date.accessioned2013-02-24T13:11:45Z-
dc.date.available2013-02-24T13:11:45Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1984-
dc.identifier.citationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.31, no.10, pp.1394 - 1398-
dc.identifier.issn0018-9383-
dc.identifier.urihttp://hdl.handle.net/10203/57387-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA NEW TECHNIQUE FOR CHARACTERIZATION OF THE END RESISTANCE IN MODULATION-DOPED FETS-
dc.typeArticle-
dc.identifier.wosidA1984TF62500006-
dc.identifier.scopusid2-s2.0-0021501452-
dc.type.rimsART-
dc.citation.volume31-
dc.citation.issue10-
dc.citation.beginningpage1394-
dc.citation.endingpage1398-
dc.citation.publicationnameIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.contributor.localauthorLee, Kwyro-
dc.contributor.nonIdAuthorSHUR, MS-
dc.contributor.nonIdAuthorVALOIS, AJ-
dc.contributor.nonIdAuthorROBINSON, GY-
dc.contributor.nonIdAuthorZHU, XC-
dc.contributor.nonIdAuthorVANDERZIEL, A-
dc.type.journalArticleArticle-
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