Characterization of Two-Dimensional Impurity Profile in Silicon실리콘에서의 2차원적 불순물의 분포의 산출
- Publisher
- 대한전자공학회
- Issue Date
- 1986-11
- Language
- Korean
- Citation
전자공학회지, v.23, no.6, pp.189 - 195
- ISSN
- 1975-2377
- Appears in Collection
- EE-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.