반도체 감사공정의 생산성향상 모형 = A model of productivity improvement for the semiconductor test process

Advisors
김보원researcherKim, Bo-Wonresearcher
Publisher
한국과학기술원
Issue Date
1999
Identifier
151224/325007 / 000973214
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 테크노경영대학원, 1999.2, [ vii, 98 p. ]

Keywords

검사공정; 반도체; 생산성향상; Productivity improvement; Test process; Semiconductor

URI
http://hdl.handle.net/10203/54117
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=151224&flag=t
Appears in Collection
KGSM-Theses_Master(석사논문)
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