Effects of the functional groups of non-conductive films(NCFs) on materials properties and reliability of NCFs flip-chip-on-organic boards플립칩 접속을 위한 비전도성 필름의 관능기가 물질특성 및 신뢰성에 미치는 영향

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In this study, effects of the functional groups of non-conductive films (NCFs) on materials properties and reliability of NCFs-bonded flip-chip-on-board (FCOB) assemblies were investigated. The most important issue in NCFs-bonded flip-chip-on-board (FCOB) assemblies is thermal cycling reliability. Thermo-mechanical properties such as glass transition temperature (Tg), modulus (E), and thermal expansion coefficient (CTE) of cured NCFs significantly affect to the thermal cycling reliability of NCFs-bonded FCOB assembly. Therefore, this study has been mainly focused on the improvement of thermo-mechanical properties of NCFs by controlling the number of functional groups of NCFs resin. The functionality modified NCFs-bonded FCOB assembly showed significantly enhanced reliability under thermal cycling test environment. To compare the reliability of conventional and modified NCFs-bonded FCOB assemblies after thermal cycling test, electrical analysis and scanning acoustic microscopy (SAM) investigation were performed. Thermal deformations of each NCFs-bonded FCOB assembly under thermal cycling environment were also investigated and quantitatively compared using high sensitivity Twyman-Green interferometry and Portable Engineering $Moir\acute{e}$ Interferometry (PEMI). According to experimental results, the functional groups of NCFs have great effects on thermo-mechanical properties of cured NCFs, thermal deformations, and thermal cycling reliability of NCFs-bonded FCOB assemblies.
Advisors
Paik, Kyung-Wookresearcher백경욱researcher
Description
한국과학기술원 : 신소재공학과,
Publisher
한국과학기술원
Issue Date
2006
Identifier
255422/325007  / 020043558
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2006.2, [ 76 p. ]

Keywords

Interfacial delamination; Thermal cycling reliability; Thermo-mechanical properties; Functional group; Non-Conductive Films (NCFs); Thermal deformation; 전단 변형; 계면 박리; 열-싸이클 신뢰성; 열-기계적 물성; 에폭시 관능기; 비전도성 필름; Shear strain

URI
http://hdl.handle.net/10203/51683
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=255422&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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