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Results 1-1 of 1 (Search time: 0.037 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
The characteristic carrier-Er interaction distance in Er-doped a-Si/SiO2 superlattices formed by ion sputtering

Ji-Hong Jhe; Shin, JungHoonresearcher; Kyung Joong Kim; Dae Won Moon, APPLIED PHYSICS LETTERS, v.82, no.25, pp.4489 - 4491, 2003-06

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