赤外線領域에서의 銅, 알루미늄 및 炭素薄膜의 輻射能 測定Emissivity measurement of copper, aluminum and carbon film in infrared region

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dc.contributor.advisor이상수-
dc.contributor.advisorLee, Sang-Soo-
dc.contributor.author이두희-
dc.contributor.authorLee, Doo-Hee-
dc.date.accessioned2011-12-14T07:47:29Z-
dc.date.available2011-12-14T07:47:29Z-
dc.date.issued1982-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=63289&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/48006-
dc.description학위논문(석사) - 한국과학기술원 : 물리학과, 1982.2, [ iii, 64 p. ]-
dc.languagekor-
dc.publisher한국과학기술원-
dc.title赤外線領域에서의 銅, 알루미늄 및 炭素薄膜의 輻射能 測定-
dc.title.alternativeEmissivity measurement of copper, aluminum and carbon film in infrared region-
dc.typeThesis(Master)-
dc.identifier.CNRN63289/325007-
dc.description.department한국과학기술원 : 물리학과, -
dc.identifier.uid000801188-
dc.contributor.localauthor이두희-
dc.contributor.localauthorLee, Doo-Hee-
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PH-Theses_Master(석사논문)
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