박막트랜지스터 구조에서의 비정질 규소의 상태밀도 측정과 준 안정성 연구Density of states measurement and metastability of amorphous silicon in thin film transistor structure
- Advisors
- 이주천; Lee, Choo-Chon
- Description
- 한국과학기술원 : 물리학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1994
- Identifier
- 68891/325007 / 000815139
- Language
- kor
- Description
학위논문(박사) - 한국과학기술원 : 물리학과, 1994.2, [ viii, 99 p. ]
- Appears in Collection
- PH-Theses_Ph.D.(박사논문)
- Files in This Item
- There are no files associated with this item.
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