박막트랜지스터 구조에서의 비정질 규소의 상태밀도 측정과 준 안정성 연구 = Density of states measurement and metastability of amorphous silicon in thin film transistor structure

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Advisors
이주천Lee, Choo-Chon
Description
한국과학기술원 : 물리학과,
Publisher
한국과학기술원
Issue Date
1994
Identifier
68891/325007 / 000815139
Language
kor
Description

학위논문(박사) - 한국과학기술원 : 물리학과, 1994.2, [ viii, 99 p. ]

URI
http://hdl.handle.net/10203/47472
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=68891&flag=dissertation
Appears in Collection
PH-Theses_Ph.D.(박사논문)
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