Search

Start a new search
Current filters:
Add filters:
  • Results/Page
  • Sort items by
  • In order
  • Authors/record

Results 1-1 of 1 (Search time: 0.003 seconds).

1

Border-trap characterization in high-kappa strained-si MOSFETs

Maji, Debabrata; Duttagupta, S. P.; Rao, V. Rarngopal; Yeo, Chia Ching; Cho, Byung Jinresearcher, IEEE ELECTRON DEVICE LETTERS, v.28, no.8, pp.731 - 733, 2007-08

rss_1.0 rss_2.0 atom_1.0