Results 1-2 of 2 (Search time: 0.002 seconds).
|NO||Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)||Altmetrics|
ArticleDoes short wavelength lithography process degrade the integrity of thin gate oxide?
Kim, SJ; Cho, Byung Jinresearcher; Chong, PF; Chor, EF; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, MICROELECTRONICS RELIABILITY, v.40, pp.1609 - 1613, 2000
ArticleReliability of thin gate oxides irradiated under X-ray lithography conditions
Cho, Byung Jinresearcher; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4B, pp.2819 - 2822, 2001-04