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|NO||Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)|
|1||Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides|
Ang, CH; Ling, CH; Cho, Byung Jinresearcher; Kim, SJ; Cheng, ZY, SOLID-STATE ELECTRONICS, v.44, no.11, pp.2001 - 2007, 2000-11
|2||Reliability of thin gate oxides irradiated under X-ray lithography conditions|
Cho, Byung Jinresearcher; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4B, pp.2819 - 2822, 2001-04