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Results 1-10 of 173 (Search time: 0.002 seconds).

1

Identifying and quantitating defects on chemical vapor deposition grown graphene layers by selected electrochemical deposition of Au nanoparticles

So, Hye-Mi; Mun, Jeong Hun; Bang, Gyeong Sook; Kim, Taek Yong; Cho, Byung Jinresearcher; Ahn, Chi Won한국탄소학회Carbon Letters, v.13, no.1, pp.56 - 59, 2012-01

2

Reduction of metal-graphene contact resistance by direct growth of graphene over metal

Hong, Seul Ki; Song, Seung Min; Sul, One Jae; Cho, Byung Jinresearcher한국탄소학회Carbon Letters, v.14, no.3, pp.171 - 174, 2013-07

3

Contact resistance in graphene channel transistors

Song, Seung Min; Cho, Byung Jinresearcher한국탄소학회Carbon Letters, v.14, no.3, pp.162 - 170, 2013-07

4

First Demonstration of Ultra-Thin SiGe-Channel Junctionless Accumulation-Mode (JAM) Bulk FinFETs on Si Substrate with PN Junction-Isolation Scheme

Kim, Dong-Hyun; Kim, Tae Kyun; Yoon, Young Gwang; Hwang, Byeong-Woon; Choi, Yang-Kyuresearcher; Cho, Byung Jinresearcher; Lee, Seok-HeeresearcherIEEEJournal of the Electron Devices Society, v.2, no.5, pp.123 - 127, 2014-09

5

Evaluation of double spacer local oxidation of silicon (LOCOS) isolation process for sub-quarter micron design rule

Jang, SA; Kim, YB; Cho, Byung Jinresearcher; Kim, JCJAPAN J APPLIED PHYSICSJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.36, no.3B, pp.1433 - 1438, 1997-03

6

A thorough study of quasi-breakdown phenomenon of thin gate oxide in dual-gate CMOSFETs

Guan, H; Li, MF; He, YD; Cho, Byung Jinresearcher; Dong, ZIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.47, no.8, pp.1608 - 1616, 2000-08

7

Effect of substrate hot-carrier injection on quasibreakdown of ultrathin gate oxide

Cho, Byung Jinresearcher; Xu, Z; Guan, H; Li, MFAMER INST PHYSICSJOURNAL OF APPLIED PHYSICS, v.86, no.11, pp.6590 - 6592, 1999-12

8

Anomalous field-oxide-ungrowth phenomenon in recessed local oxidation of silicon isolation structure

Cho, Byung Jinresearcher; Jang, S.-A.; Kim, Y.-B.; Lee, D.-D.; Kim, J.-C.Electrochemical Society, Inc.JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.144, no.1, pp.320 - 326, 1997-01

9

ESTIMATION OF EFFECTIVE DIFFUSION TIME IN A RAPID THERMAL-DIFFUSION USING A SOLID DIFFUSION SOURCE

Cho, Byung Jinresearcher; PARK, SK; Kim, Choong KiIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.39, no.1, pp.111 - 117, 1992-01

10

Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias

Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung JinresearcherJAPAN J APPLIED PHYSICSJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.39, no.7B, pp.757 - 759, 2000-07

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