Browse "EE-Conference Papers(학술회의논문)" by Subject All-Around Gate

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Sub-5nm All-Around Gate FinFET for Ultimate Scaling

Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; et al, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13

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