Browse "EE-Conference Papers(학술회의논문)" by Type Conference

Showing results 17761 to 17780 of 22772

17761
Terahertz Time Domain Spectroscopy of Vertical Silicon Nanowires

Lim, Meehyun; Choi, Sung Jin; Moon, Kiwon; Jung, Euna; Seol, Meol Lok; Do, Youngwoong; Choi, Yang-Kyu; et al, 36th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), pp.11, IEEE, 2011-10-03

17762
Terminal Sliding Mode Control of Robot Manipulators for PTP Task

Park, K.B.; Lee, Ju-Jang, 10th Korea Automatic Control Conference, pp.267 - 270, Korea Automatic Control Conference, 1995-10

17763
Terrain Mapping for a Roving Planetary Explorer

Kweon, In-So; Hebert, M; Krotkov, E; Kanade, T, IEEE International Conference on Robotics and Automation, pp.997 - 1002, IEEE, 1989-05

17764
Tessellation-enabled shader for a bandwidth-limited 3D graphics engine

Chung, K.; Yu, C.-H.; Kim, D.; Kim, Lee-Sup, IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, pp.367 - 370, 2008-09-21

17765
Test and Performance Comparison of End-to-End Available Bandwidth Measurement Tools

Han, Y.-T.; Lee, E.-M.; Park, Hong-Shik; Ryu, J.-Y.; Kim, C.-C.; Song, M.-W., 11th International Conference on Advanced Communication Technology, ICACT 2009, v.1, pp.370 - 372, IEEE, 2009-02-15

17766
Test pattern extraction for lithography modeling under design rule revisions

Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21

17767
Test Pattern Generation of Combinational Circuits using Logic Decision Diagrams

Lim, Jong-Tae; Lee, MS, ISIM 2000, pp.375 - 378, 2000-10

17768
Test-Time Adaptation via Self-Training with Nearest Neighbor Information

Jang, Minguk; Chung, Sae-Young; Chung, Hye Won, The International Conference on Learning Representations, ICLR 2023, The International Conference on Learning Representations (ICLR), 2023-05-01

17769
Test-Time Style Shifting: Handling Arbitrary Styles in Domain Generalization

Park, JungWuk; Han, Dong Jun; Kim, Soyeong; Moon, Jaekyun, 40th International Conference on Machine Learning, ICML 2023, pp.27114 - 27131, ML Research Press, 2023-07-26

17770
Test-Time Synthetic-to-Real Adaptive Depth Estimation

Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, Institute of Electrical and Electronics Engineers Inc., 2023-05-28

17771
Test-Time Synthetic-to-Real Adaptive Depth Estimation

Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, IEEE, 2023-05-29

17772
TET algorithm for neural network training with missing data attributes

Yoon, S.Y.; Lee, Soo-Young, World Congress on Neural Networks, pp.315 - 318, 1996

17773
Text independent speaker identification sysem using ICA mixture model

Lee, Hwang Soo; Kyung, YJ; Lee , JI, WESTPRAC, pp.97 - 100, 2000

17774
Text Independent Speaker Recognition Using Micro-Prosody

Lee, Hwang Soo; Kyung, YJ, International Conference on Spoken Language Processing, pp.157 - 160, 1998

17775
Text-Independent Speaker Identification using Soft Channel Selection in a Multi-Microphone Environment

Ji, M; Kim, S; Kim, HoiRin; Yoon, H, IEEE ICCE 2008, pp.0 - 0, IEEE, 2008-01

17776
Text-Independent Speaker Recognition for Ubiquitous Robot Companion

Kim, S; Ji, M; Kwak, KC; Chi, SY; Kim, HoiRin, URAI 2006, pp.361 - 364, 로봇공학회, 2006-10

17777
Text-to-Speech 합성음 품질 평가

정유현; 최준혁; 한민수, 음향학회 학술논문발표대회, v.12, no.1, pp.229 - 232, 한국음향학회, 1993-06

17778
Textile Based Organic Light Emitting Diodes for Wearable Displays

Kim, Woohyun; Kwon, Seonil; Kim, Jin Yeong; Han, Yuncheol; Kim, Eungtaek; Park, Sungmee; Park, Byoung-Cheul; et al, The 13th International Meeting on Information Display, IMID 2013, The 13th International Meeting on Information Display, IMID 2013, 2013-08-28

17779
Texture analysis and artificial neural network for detection of clustered microcalcifications on mammograms

Kim, Jong Kook; Park, Jeong Mi; Song, Koun Sik; Park, HyunWook, Proceedings of the 1997 7th IEEE Workshop on Neural Networks for Signal Processing, NNSP'97, pp.199 - 206, IEEE, 1997-09-24

17780
Texture Classification Based on Discriminative Component Selection of Local Binary Pattern and Variants

Han, Dongyoon; Kim, Junmo, 20th Korea-Japan Joint Workshop on Frontiers of Computer Vision, Asian Federation of Computer Vision (AFCV), 2014-02-05

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