위상광간섭에 의한 표면형상의 초정밀 측정Ultraprecision surface measuring interferometry

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Advisors
김승우researcherKim, Seung-Wooresearcher
Description
한국과학기술원 : 정밀공학과,
Publisher
한국과학기술원
Issue Date
1992
Identifier
60279/325007 / 000901171
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 정밀공학과, 1992.2, [ [iii], 49 p. ]

URI
http://hdl.handle.net/10203/43777
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=60279&flag=dissertation
Appears in Collection
ME-Theses_Master(석사논문)
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