전자 패키지에서 다층 구조의 기계적인 신뢰성에 관한 연구A study on mechanical reliability of multi- layered structure in electronic packages

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Advisors
엄윤용researcherEarmme, Youn-Youngresearcher
Description
한국과학기술원 : 기계공학전공,
Publisher
한국과학기술원
Issue Date
2002
Identifier
177247/325007 / 000965096
Language
kor
Description

학위논문(박사) - 한국과학기술원 : 기계공학전공, 2002.8, [ x, 107 p. ]

Keywords

계면파괴역학; 신뢰성; 다층 구조; 전자 패키지; 열응력; thermal stress; interfacial fracture mechanics; reliability; multi-layered structure; electronic packages

URI
http://hdl.handle.net/10203/43146
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=177247&flag=dissertation
Appears in Collection
ME-Theses_Ph.D.(박사논문)
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