Thermal modeling of heterojunction bipolar transistors with pulsed I-V measurements

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dc.contributor.authorPark, Hyun-Minko
dc.contributor.authorJeon, Kye-Ikko
dc.contributor.authorHong, Songcheolko
dc.date.accessioned2008-04-21T10:28:41Z-
dc.date.available2008-04-21T10:28:41Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-03-
dc.identifier.citationMICROWAVE JOURNAL, v.44, no.3, pp.128 - 128-
dc.identifier.issn0192-6225-
dc.identifier.urihttp://hdl.handle.net/10203/4048-
dc.description.abstractAn extraction procedure for thermal parameters of high power heterojunction bipolar transistors (HBT) with pulsed I-V measurements is presented. The pulsed measurements become essential to model thermal effect and frequency dispersion of high frequency devices. The measurement setup used here can be configured with commercially available components.-
dc.description.sponsorshipThe material for this article was first presented at the European Microwave Conference held in Paris, October 2000. *en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherHORIZON HOUSE PUBLICATIONS INC-
dc.subjectRESISTANCE-
dc.titleThermal modeling of heterojunction bipolar transistors with pulsed I-V measurements-
dc.typeArticle-
dc.identifier.wosid000167727300027-
dc.identifier.scopusid2-s2.0-0035271761-
dc.type.rimsART-
dc.citation.volume44-
dc.citation.issue3-
dc.citation.beginningpage128-
dc.citation.endingpage128-
dc.citation.publicationnameMICROWAVE JOURNAL-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorHong, Songcheol-
dc.contributor.nonIdAuthorPark, Hyun-Min-
dc.contributor.nonIdAuthorJeon, Kye-Ik-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordPlusRESISTANCE-
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