CMOS Latch-Up 현상의 실험적 해석 = Experimental analysis of CMOS Latch-Up phenomena

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Advisors
김충기researcher경종민researcherKim, Choong-KiresearcherKyung, Chong-Minresearcher
Description
한국과학기술원 : 전기 및 전자공학과,
Publisher
한국과학기술원
Issue Date
1985
Identifier
64629/325007 / 000831013
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 전기 및 전자공학과, 1985.2, [ [ii], 59 p. ]

URI
http://hdl.handle.net/10203/39688
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=64629&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
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