CMOS Latch-Up 현상의 실험적 해석Experimental analysis of CMOS Latch-Up phenomena
- Advisors
- 김충기; 경종민; Kim, Choong-Ki; Kyung, Chong-Min
- Description
- 한국과학기술원 : 전기 및 전자공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1985
- Identifier
- 64629/325007 / 000831013
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 전기 및 전자공학과, 1985.2, [ [ii], 59 p. ]
- Appears in Collection
- EE-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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