Formation of TiO2 thin films using NH3 as catalyst by metalorganic chemical vapor deposition

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dc.contributor.authorJung, Sung-Hoonko
dc.contributor.authorKang, Sang-Wonko
dc.date.accessioned2008-04-17T06:11:30Z-
dc.date.available2008-04-17T06:11:30Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-05-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1, v.40, no.5A, pp.3147 - 3152-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/10203/3940-
dc.description.abstractWe have studied metalorganic chemical vapor deposition of TiO2 thin films using titanium tetra-isopropoxide [TTIP, Ti(O-C3H7)(4)] and NH3 as a catalyst at deposition temperatures ranging from 250 to 365 degreesC. At deposition temperatures above 330 degreesC, pyrolytic self-decomposition of TTIP is dominant regardless of the use of NH3, and the activation energy for TiO2 film formation is 152 kJ/mol. At deposition temperatures below 330 degreesC, the films can be formed with the help of the catalytic activity of NH3, and the activation energy is reduced to 55 kJ/mol. TiO2 films deposited through the pyrolytic self-decomposition of TTIP have an anatase structure before and after performing post-deposition annealing in oxygen ambient for 30 min at 750 degreesC. On the other hand, the as-deposited films formed through the catalytic reaction of TTIP with NH3 incorporate nitrogen impurities and have microcrystallites of the rutile structure within the amorphous matrix. However, the post-deposition annealing, the nitrogen impurities are completely removed from the films, and the films are converted into polycrystalline TiO2 films with the rutile structure, which have a high dielectric constant of 82 and a low leakage current.-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherINST PURE APPLIED PHYSICS-
dc.titleFormation of TiO2 thin films using NH3 as catalyst by metalorganic chemical vapor deposition-
dc.typeArticle-
dc.identifier.wosid000170772000019-
dc.identifier.scopusid2-s2.0-0035328792-
dc.type.rimsART-
dc.citation.volume40-
dc.citation.issue5A-
dc.citation.beginningpage3147-
dc.citation.endingpage3152-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-
dc.identifier.doi10.1143/JJAP.40.3147-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKang, Sang-Won-
dc.contributor.nonIdAuthorJung, Sung-Hoon-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorTiO2-
dc.subject.keywordAuthorCVD-
dc.subject.keywordAuthorTTIP-
dc.subject.keywordAuthorNH3-
dc.subject.keywordAuthorcatalyst-
dc.subject.keywordAuthorrutile-
dc.subject.keywordPlusATOMIC LAYER DEPOSITION-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusTITANIUM-DIOXIDE-
dc.subject.keywordPlusROOM-TEMPERATURE-
dc.subject.keywordPlusKINETICS-
dc.subject.keywordPlusCVD-
dc.subject.keywordPlusPRECURSOR-
dc.subject.keywordPlusOXIDATION-
dc.subject.keywordPlusAMBIENTS-
dc.subject.keywordPlusSILICON-
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