셀 손실확률의 측정을 통한 호 연결 수락 제어 메카니즘Cell loss ratio measurement-based connection admission control
- Advisors
- 성단근researcher; Sung, Dan-Keunresearcher
- Description
- 한국과학기술원 : 전기및전자공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1997
- Identifier
- 114244/325007 / 000953475
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 전기및전자공학과, 1997.2, [ v, 68 p. ]
- Keywords
호 연결 수락 제어; 비동기식 전송방식; 셀 손실확률; Cell loss ratio; Connection admission control; ATM
- Appears in Collection
- EE-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.