Investigation of the characteristic changes on SrTiO3 : Pr,Al,Ga phosphors during low voltage electron irradiation

We have investigated the mechanism of degradation of the low voltage cathodoluminescence (CL) efficiency of SrTiO3:Pr,Al,Ga phosphors. Based on Auger electron spectroscopy and x-ray photoelectron spectroscopy study, it is understood that prolonged irradiation of the phosphor with an electron beam of low voltage and high current density causes characteristic changes [(1) accumulation of overlying carbon and (2) reduction of oxygen] to occur on the phosphor surface. These changes are responsible for the rapid degradation of low voltage CL of SrTiO3:Pr,Al,Ga phosphors. The two aforementioned changes are shown to impact CL output in an important way. An accurate accounting of the total impact of the two changes warrants assessment of the importance of other degradation mechanisms. These other degradation mechanisms include both carbon- and noncarbon-related enhanced nonradiative electron-hole recombination at surfaces. (C) 2003 American Vacuum Society.
Publisher
A V S AMER INST PHYSICS
Issue Date
2003-02
Language
ENG
Keywords

FIELD-EMISSION DISPLAYS; PHOTOELECTRON-SPECTROSCOPY; CATHODOLUMINESCENCE; CARBON; WATER; TIO2; H2O

Citation

JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.21, no.1, pp.536 - 539

ISSN
1071-1023
URI
http://hdl.handle.net/10203/3261
Appears in Collection
MS-Journal Papers(저널논문)
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