A large-signal model of RF LDMOS with skin effects of power combining structures

Publisher
IEEE
Issue Date
2005-06-12
Language
ENG
Description

The authors would like to thank Taeho Kim (KAIST), Sanghoon Jeon and Jiyoun Lim (Knowledge*on, Inc.) for their technical support.

Citation

2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers, pp.149 - 152

ISSN
1529-2517
URI
http://hdl.handle.net/10203/3174
Appears in Collection
EE-Conference Papers(학술회의논문)
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