This paper presents the development of new anisotropic conductive adhesives (ACAs) with enhanced thermal conductivity for improved reliability of adhesive flip chip assembly under high current density condition. As the bump size in the flip chip assembly is reduced, the current density through the bump also increases. This increased current density causes new failure mechanisms, such as interface degradation due to intermetallic compound formation and adhesive swelling resulting from high current stressing. This process is found especially in high current density interconnection in which the high junction temperature enhances such failure mechanisms. Therefore, it is necessary for the ACA to become a thermal transfer medium that allows the board to act as a new heat sink for the flip chip package and improve the lifetime of the ACA flip chip joint. We developed the thermally conductive ACA of 0.63 W/m(.)K thermal conductivity by using a formulation incorporating the 5-mu m Ni-filled and 0.2-mu m SiC-filled epoxy-based binder system. The current carrying capability and the electrical reliability under the current stressing condition for the thermally conductive ACA flip chip joints were improved in comparison to conventional ACA. This improvement was attributed to the effective heat dissipation from Au stud bumps/ACA/PCB pad structure by the thermally conductive ACA.