Rapid and Precise Displacement Measurement Using Time-of-Flight Detection of Femtosecond Optical Pulses
We demonstrate high-speed and high-resolution displacement measurement method by utilizing electro-optic sampling between electrical pulses from photodetection and femtosecond optical pulses. A 5.8-nm (1.9-nm) resolution is achieved in only 50 μs (14 ms) update time.
- Issue Date
- 2019-05-09
- Language
- English
- Citation
2019 Conference on Lasers and Electro-Optics, CLEO 2019
- Appears in Collection
- ME-Conference Papers(학술회의논문)
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