DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jeonghyun | ko |
dc.contributor.author | Bang, Jooeun | ko |
dc.contributor.author | Lim, Younghyun | ko |
dc.contributor.author | Choi, Jaehyouk | ko |
dc.date.accessioned | 2019-11-29T06:24:45Z | - |
dc.date.available | 2019-11-29T06:24:45Z | - |
dc.date.created | 2019-11-19 | - |
dc.date.issued | 2019-06-12 | - |
dc.identifier.citation | 33rd Symposium on VLSI Circuits, VLSI Circuits 2019, pp.C130 - C131 | - |
dc.identifier.uri | http://hdl.handle.net/10203/268710 | - |
dc.description.abstract | This work presents a digital LDO using a single-VCO-based edge-racing (SVER) time quantizer to achieve fast transient and high accuracy concurrently. As the SVER scales the sampling frequency dynamically according to the magnitude of the error in the output voltage, the transient response can be improved without the increase in the power consumption in the steady state. Since the SVER uses a single VCO, the accuracy of the output can be high against local mismatches. In measurement, this LDO achieved a 0.29 ps-transient FOM and a sub-2 mV accuracy under 0.5-V supply. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | A 0.5V-VIN, 0.29ps-Transient-FOM, and Sub-2mV-Accuracy Adaptive-Sampling Digital LDO Using Single-VCO-Based Edge-Racing Time Quantizer | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | C130 | - |
dc.citation.endingpage | C131 | - |
dc.citation.publicationname | 33rd Symposium on VLSI Circuits, VLSI Circuits 2019 | - |
dc.identifier.conferencecountry | JA | - |
dc.identifier.conferencelocation | Kyoto | - |
dc.identifier.doi | 10.23919/VLSIC.2019.8777999 | - |
dc.contributor.nonIdAuthor | Lee, Jeonghyun | - |
dc.contributor.nonIdAuthor | Bang, Jooeun | - |
dc.contributor.nonIdAuthor | Lim, Younghyun | - |
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