A 0.5V-VIN, 0.29ps-Transient-FOM, and Sub-2mV-Accuracy Adaptive-Sampling Digital LDO Using Single-VCO-Based Edge-Racing Time Quantizer

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This work presents a digital LDO using a single-VCO-based edge-racing (SVER) time quantizer to achieve fast transient and high accuracy concurrently. As the SVER scales the sampling frequency dynamically according to the magnitude of the error in the output voltage, the transient response can be improved without the increase in the power consumption in the steady state. Since the SVER uses a single VCO, the accuracy of the output can be high against local mismatches. In measurement, this LDO achieved a 0.29 ps-transient FOM and a sub-2 mV accuracy under 0.5-V supply.
Publisher
Institute of Electrical and Electronics Engineers Inc.
Issue Date
2019-06-12
Language
English
Citation

33rd Symposium on VLSI Circuits, VLSI Circuits 2019, pp.C130 - C131

DOI
10.23919/VLSIC.2019.8777999
URI
http://hdl.handle.net/10203/268710
Appears in Collection
RIMS Conference Papers
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