Far-field imaging of subwavelength scale object based on multi-channel metamaterials다중채널 메타물질을 이용한 파장보다 작은 물체의 원거리 이미지 구현

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Subwavelength object imaging is fundamentally restricted by diffraction limit. The limitation is originated by evanescent wave which is essential for fine structure imaging. Negative index metamaterial with a grating shape has been studied to transfer decaying wave information beyond proximity, but aliasing effect between original wave and transformed decaying wave is unresolved. Distinguishability on diffracted light is a first priority when the wave information is detected. We demonstrate that an interweaving conductor metamaterial (ICM) is applied to transmit diffracted light separately without mixing. An analysis of image retrieval process is also performed concisely and accurately by transfer matrix inversion. To collect diffracted light at once, sampling expansion method is implemented by locating a sequence of small object. Finally, we show perfect image reconstruction of any subwavelength aperture which is expressed within 3 times free-space wave vector in simulation region.
Advisors
Shin, Jonghwaresearcher신종화researcher
Description
한국과학기술원 :신소재공학과,
Publisher
한국과학기술원
Issue Date
2017
Identifier
325007
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2017.2,[iii, 40 p. :]

Keywords

diffraction limit▼asuper lens▼aaliasing▼ainterweaving conductor metamaterial (ICM)▼aimage reconstruction process; 회절한계▼a슈퍼렌즈▼a알리아싱▼a다중채널 메타물질▼a이미지 구현 프로세스

URI
http://hdl.handle.net/10203/266480
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=867027&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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