(A) non-invasive defect detection and localization method, and a self-repair redundancy configuration for improved reliability of through silicon via (TSV) based 2.5D/3D IC = 관통 실리콘 비아 기반 2.5/3차원 집적회로의 신뢰성 향상을 위한 비침습 결함 검출 및 위치 추적 방법과 자체 복구 중복구성

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Through silicon via (TSV) based 2.5D/3D IC technology allows low data rate, low power consumption, high data bandwidth, and small form factor system. For higher data bandwidth transfer in next generation 2.5D/3D ICs, the number of TSVs is forecasted to increase with reduced diameter and pitch. Due to the downsizing of TSVs, the fabrication becomes more challenging to maintain high yield. In addition, it is limited to access thousands of TSVs for testing and verifying the reliability. This thesis proposes a non-invasive defect detection and localization method and self-repair redundancy configuration for improved reliability of TSV based 2.5D/3D IC. The effect of open and short defects on TSV channel is analyzed for detection and localization, and the proposed method is experimentally verified with up to 8-stack TSV daisy-chain test vehicles. Furthermore, a self-repair TSV redundancy configuration is proposed; TSV test circuit and redundancy configuration are designed and verified with the simulation results. The proposed self-repair redundancy configuration successfully improves the yield, time delay, and power consumption compared to conventional designs.
Advisors
Kim, Jounghoresearcher김정호researcher
Description
한국과학기술원 :전기및전자공학부,
Publisher
한국과학기술원
Issue Date
2019
Identifier
325007
Language
eng
Description

학위논문(박사) - 한국과학기술원 : 전기및전자공학부, 2019.2,[iv, 54 p. :]

Keywords

2.5D/3D IC▼adefect detection▼adefect localization▼aredundancy configuration▼aself-repair▼athrough silicon via; 2.5/3차원 집적회로▼a결함 검출▼a위치 추적▼a중복구성▼a자체 복구▼a관통 실리콘 비아

URI
http://hdl.handle.net/10203/265154
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=842214&flag=dissertation
Appears in Collection
EE-Theses_Ph.D.(박사논문)
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