In situ runout identification in active magnetic bearing system by extended influence coefficient method
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, CS | ko |
| dc.contributor.author | Lee, Chong-Won | ko |
| dc.date.accessioned | 2008-01-07T02:04:52Z | - |
| dc.date.available | 2008-01-07T02:04:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997-03 | - |
| dc.identifier.citation | IEEE-ASME TRANSACTIONS ON MECHATRONICS, v.2, no.1, pp.51 - 57 | - |
| dc.identifier.issn | 1083-4435 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/2627 | - |
| dc.description.abstract | In this paper, an efficient, Set easy-to-use, in-situ runout identification scheme, based on the extended influence coefficient method, is presented for active magnetic bearing (AMB) systems, It is shown experimentally that the proposed scheme successfully identifies and eliminates the troublesome runout of a well-balanced AMB system in the laboratory, so that a high-precision spindle system can be achieved, while it is in operation. | - |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | In situ runout identification in active magnetic bearing system by extended influence coefficient method | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1997WN03700006 | - |
| dc.identifier.scopusid | 2-s2.0-0031095040 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 2 | - |
| dc.citation.issue | 1 | - |
| dc.citation.beginningpage | 51 | - |
| dc.citation.endingpage | 57 | - |
| dc.citation.publicationname | IEEE-ASME TRANSACTIONS ON MECHATRONICS | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Lee, Chong-Won | - |
| dc.contributor.nonIdAuthor | Kim, CS | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | active magnetic bearing | - |
| dc.subject.keywordAuthor | directional spectrum | - |
| dc.subject.keywordAuthor | extended influence coefficient method | - |
| dc.subject.keywordAuthor | runout identification | - |
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