Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

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A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.
Publisher
AMERICAN PHYSICAL SOC
Issue Date
2002-04
Language
English
Article Type
Article
Keywords

PULSES; GENERATION

Citation

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, v.5, no.4

ISSN
1098-4402
DOI
10.1103/PhysRevSTAB.5.042801
URI
http://hdl.handle.net/10203/255922
Appears in Collection
PH-Journal Papers(저널논문)
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