Browse "GT-Journal Papers(저널논문)" by Author Woo, Seongho

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E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs

Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoungresearcher, MICROELECTRONICS RELIABILITY, v.98, pp.161 - 164, 2019-07

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