Method to reduce an unwanted EM field component in a 4-port TEM cell

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As an alternative standard electromagnetic (EM) field generator, a 4-port TEM (transverse EM) cell can be used for an EM compatibility (EMC) emission and immunity test. However, unwanted EM fields generated in a TEM cell deteriorate the results and accuracy of critical EMC tests. A new method to suppress unwanted field components in a 4-port TEM cell is proposed. To reduce the unwanted EM field, the narrow slits in internal septa are inserted, which are transverse with respect to the direction of wave propagation. By introducing the slits, the 4-port TEM cell can provide improved standard EM field distribution with the much-lowered unwanted field component inside the usable test volume.
Publisher
INST ENGINEERING TECHNOLOGY-IET
Issue Date
2018-04
Language
English
Article Type
Article
Keywords

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Citation

ELECTRONICS LETTERS, v.54, no.8, pp.488 - 489

ISSN
0013-5194
DOI
10.1049/el.2017.4831
URI
http://hdl.handle.net/10203/244698
Appears in Collection
EE-Journal Papers(저널논문)
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