Development of scanning single port free space measurement setup for imaging reflection loss of microwave absorbing materials

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This paper proposes a scanning free-space measurement (SFSM) setup for the evaluation of microwave absorption properties of microwave absorbing materials. The system comprises of a vector network analyzer (VNA), focused horn antennas attached to the VNA for transmitting/receiving microwave signals, a dual-axis automated translation stage for raster scanning of the specimen and a standard personal computer. A graphical user interface (GUI) running on the computer manages the configuration and synchronization of the VNA and the stage system, measurement reception from VNA and compilation of results for display to the user. The GUI is created in C + + using Qt framework and Qt Widgets for Technical applications. It is designed with a minimalistic approach to promote usability and adaptability.
Publisher
ELSEVIER SCI LTD
Issue Date
2018-09
Language
English
Article Type
Article
Citation

MEASUREMENT, v.125, pp.114 - 122

ISSN
0263-2241
DOI
10.1016/j.measurement.2018.04.065
URI
http://hdl.handle.net/10203/244589
Appears in Collection
AE-Journal Papers(저널논문)
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