On the detection of multiple events in atom probe tomography

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In atom probe tomography (APT), multiple events can arise as a consequence of e.g. correlated field evaporation and molecular ion dissociation. They represent challenging cases for single-particle detectors and can cause compositional as well as spatial inaccuracies. Here, two state-of-the-art atom probe microscopes (Cameca LEAP 5000 XS and 5000 XR) were used to investigate cemented tungsten carbide, which exhibits high amounts of multiple events. By advanced data analysis methods, the natural character of the multiple events, as well as the performance of the APT detectors, are assessed. Accordingly, possible signal loss mechanisms are discussed. (C) 2018 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2018-06
Language
English
Article Type
Article
Keywords

FIELD EVAPORATION; MASS-SPECTRA; STEELS

Citation

ULTRAMICROSCOPY, v.189, pp.54 - 60

ISSN
0304-3991
DOI
10.1016/j.ultramic.2018.03.018
URI
http://hdl.handle.net/10203/242534
Appears in Collection
MS-Journal Papers(저널논문)
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