A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity

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The time-domain gating method (TGM) is an accurate and useful method to characterize the test fixtures used in the measurement of high-speed connectors. However, its accuracy can be degraded by the gating error when the test fixture contains the impedance discontinuity near the fixture end facing the device under test. To overcome this limitation, this letter proposes a two-line TGM (2LTGM) for characterizing the test fixtures having the discontinuities such as via holes. The proposed method does not require any modification of the test fixtures with the help of the proposed test structures and T-parameter extraction procedure. The experimental results show that the proposed 2LTGM has an 8 dB lower mean square error than the conventional TGM for the test fixtures having via hole discontinuities at the end. We expect that the 2LTGM can improve the accuracy for characterizing the test fixtures with any discontinuities not limited to the via holes.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2017-10
Language
English
Article Type
Article
Citation

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.27, no.10, pp.936 - 938

ISSN
1531-1309
DOI
10.1109/LMWC.2017.2746686
URI
http://hdl.handle.net/10203/226716
Appears in Collection
GT-Journal Papers(저널논문)
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