Evaluation of Analysis Conditions for Laser-Pulsed Atom Probe Tomography: Example of Cemented Tungsten Carbide

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dc.contributor.authorPeng, Zirongko
dc.contributor.authorChoi, Pyuck-Pako
dc.contributor.authorGault, Baptisteko
dc.contributor.authorRaabe, Dierkko
dc.date.accessioned2017-08-08T06:53:53Z-
dc.date.available2017-08-08T06:53:53Z-
dc.date.created2017-08-07-
dc.date.created2017-08-07-
dc.date.created2017-08-07-
dc.date.issued2017-04-
dc.identifier.citationMICROSCOPY AND MICROANALYSIS, v.23, no.2, pp.431 - 442-
dc.identifier.issn1431-9276-
dc.identifier.urihttp://hdl.handle.net/10203/225259-
dc.description.abstractCemented tungsten carbide has been analyzed using laser-pulsed atom probe tomography (APT). The influence of experimental parameters, including laser pulse energy, pulse repetition rate, and specimen base temperature, on the acquired data were evaluated from different aspects, such as mass spectrum, chemical composition, noise-to-signal ratio, and multiple events. Within all the applied analysis conditions, only 1 MHz pulse repetition rate led to a strong detector saturation effect, resulting in a largely biased chemical composition. A comparative study of the laser energy settings showed that an similar to 12 times higher energy was required for the less focused green laser of the LEAP(TM) 3000X HR system to achieve a similar evaporation field as the finer spot ultraviolet laser of the LEAP(TM) 5000 XS system.-
dc.languageEnglish-
dc.publisherCAMBRIDGE UNIV PRESS-
dc.subjectFIELD-ION MICROSCOPE-
dc.subjectMASS-SPECTRA-
dc.subjectQUANTITATIVE-ANALYSIS-
dc.subjectELECTRON-MICROSCOPY-
dc.subjectTEMPERATURE RISE-
dc.subjectCARBON CONTENT-
dc.subjectFE-C-
dc.subjectSPECIMEN-
dc.subjectEVAPORATION-
dc.subjectSTEEL-
dc.titleEvaluation of Analysis Conditions for Laser-Pulsed Atom Probe Tomography: Example of Cemented Tungsten Carbide-
dc.typeArticle-
dc.identifier.wosid000405595600028-
dc.identifier.scopusid2-s2.0-85009831543-
dc.type.rimsART-
dc.citation.volume23-
dc.citation.issue2-
dc.citation.beginningpage431-
dc.citation.endingpage442-
dc.citation.publicationnameMICROSCOPY AND MICROANALYSIS-
dc.identifier.doi10.1017/S1431927616012654-
dc.contributor.localauthorChoi, Pyuck-Pa-
dc.contributor.nonIdAuthorPeng, Zirong-
dc.contributor.nonIdAuthorGault, Baptiste-
dc.contributor.nonIdAuthorRaabe, Dierk-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthoratom probe tomography-
dc.subject.keywordAuthorlaser-pulsing-
dc.subject.keywordAuthordata quality-
dc.subject.keywordAuthortungsten carbide-
dc.subject.keywordPlusFIELD-ION MICROSCOPE-
dc.subject.keywordPlusMASS-SPECTRA-
dc.subject.keywordPlusQUANTITATIVE-ANALYSIS-
dc.subject.keywordPlusELECTRON-MICROSCOPY-
dc.subject.keywordPlusTEMPERATURE RISE-
dc.subject.keywordPlusCARBON CONTENT-
dc.subject.keywordPlusFE-C-
dc.subject.keywordPlusSPECIMEN-
dc.subject.keywordPlusEVAPORATION-
dc.subject.keywordPlusSTEEL-
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