A 82-nW Chaotic Map True Random Number Generator Based on a Sub-Ranging SAR ADC

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dc.contributor.authorKim, Minseoko
dc.contributor.authorHa, Unsooko
dc.contributor.authorLee, Kyuho Jasonko
dc.contributor.authorLee, Yongsuko
dc.contributor.authorYoo, Hoi-Junko
dc.date.accessioned2017-08-08T06:05:24Z-
dc.date.available2017-08-08T06:05:24Z-
dc.date.created2017-07-17-
dc.date.created2017-07-17-
dc.date.issued2017-07-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.7, pp.1953 - 1965-
dc.identifier.issn0018-9200-
dc.identifier.urihttp://hdl.handle.net/10203/225081-
dc.description.abstractAn ultra-low power true random number generator (TRNG) based on a sub-ranging SAR analog-to-digital converter (ADC) is proposed. The proposed TRNG is composed of a coarse-SAR ADC with a low-power adaptive-reset comparator and a low-power dynamic amplifier. The coarse-ADC part is shared with a sub-ranging SAR ADC for area reduction. The shared coarse-ADC not only plays the role of discrete-time chaotic circuit but also reduces the overall SAR ADC energy consumption by selectively activating the fine-SAR ADC. Also, the proposed dynamic residue amplifier consumes only 48 nW and the adaptive-reset comparator generates a chaotic map with only 6-nW consumption. The proposed TRNG core occupies 0.0045 mm(2) in 0.18-mu m CMOS technology and consumes 82 nW at 270-kbps throughput with 0.6-V supply. It successfully passes all of National Institute of Standards and Technology (NIST) tests, and it achieves the state-of-the-art figure-of-merit of 0.3 pJ/bit.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectCMOS-
dc.subjectENTROPY-
dc.subjectIMPLEMENTATION-
dc.subjectSYSTEMS-
dc.subjectDESIGN-
dc.titleA 82-nW Chaotic Map True Random Number Generator Based on a Sub-Ranging SAR ADC-
dc.typeArticle-
dc.identifier.wosid000404301300020-
dc.identifier.scopusid2-s2.0-85018914009-
dc.type.rimsART-
dc.citation.volume52-
dc.citation.issue7-
dc.citation.beginningpage1953-
dc.citation.endingpage1965-
dc.citation.publicationnameIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.identifier.doi10.1109/JSSC.2017.2694833-
dc.contributor.localauthorYoo, Hoi-Jun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorAdaptive-reset comparator-
dc.subject.keywordAuthoranalog to digital conversion-
dc.subject.keywordAuthorchaotic map-
dc.subject.keywordAuthorcryptography-
dc.subject.keywordAuthorencryption-
dc.subject.keywordAuthorradio-frequency identification (RFID)-
dc.subject.keywordAuthorsecurity-
dc.subject.keywordAuthortrue random number generators (TRNGs)-
dc.subject.keywordPlusCMOS-
dc.subject.keywordPlusENTROPY-
dc.subject.keywordPlusIMPLEMENTATION-
dc.subject.keywordPlusSYSTEMS-
dc.subject.keywordPlusDESIGN-
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