Porous Silicon Gradient Refractive Index Micro-Optics

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dc.contributor.authorKrueger, Neil A.ko
dc.contributor.authorHolsteen, Aaron L.ko
dc.contributor.authorKang, Seung-Kyunko
dc.contributor.authorOcier, Christian R.ko
dc.contributor.authorZhou, Weijunko
dc.contributor.authorMensing, Glennysko
dc.contributor.authorRogers, John A.ko
dc.contributor.authorBrongersma, Mark L.ko
dc.contributor.authorBraun, Paul V.ko
dc.date.accessioned2017-07-18T05:43:52Z-
dc.date.available2017-07-18T05:43:52Z-
dc.date.created2017-07-07-
dc.date.created2017-07-07-
dc.date.issued2016-12-
dc.identifier.citationNANO LETTERS, v.16, no.12, pp.7402 - 7407-
dc.identifier.issn1530-6984-
dc.identifier.urihttp://hdl.handle.net/10203/224803-
dc.description.abstractThe emergence and growth of transformation optics over the past decade has revitalized interest in how a gradient refractive index (GRIN) can be used to control light propagation. Two-dimensional demonstrations with lithographically defined silicon (Si) have displayed the power of GRIN optics and also represent a promising opportunity for integrating compact optical elements within Si photonic integrated circuits. Here, we demonstrate the fabrication of three-dimensional Si-based GRIN micro-optics through the shape-defined formation of porous Si (PSi). Conventional microfabrication creates Si square microcolumns (SMCs) that can be electrochemically etched into PSi elements with nanoscale porosity along the shape-defined etching pathway, which imparts the geometry with structural birefringence. Free-space characterization of the transmitted intensity distribution through a homogeneously etched PSi SMC exhibits polarization splitting behavior resembling that of dielectric metasurfaces that require considerably more laborious fabrication. Coupled birefringence/GRIN effects are studied by way of PSi SMCs etched with a linear (increasing from edge to center) GRIN profile. The transmitted intensity distribution shows polarization-selective focusing behavior with one polarization focused to a diffraction-limited spot and the orthogonal polarization focused into two laterally displaced foci. Optical thickness-based analysis readily predicts the experimentally observed phenomena, which strongly match finite-element electromagnetic simulations.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.subjectLUNEBURG LENS-
dc.subjectTRANSFORMATION OPTICS-
dc.subjectSUPERLATTICES-
dc.subjectDIELECTRICS-
dc.subjectLIGHT-
dc.subjectCLOAK-
dc.titlePorous Silicon Gradient Refractive Index Micro-Optics-
dc.typeArticle-
dc.identifier.wosid000389963200014-
dc.identifier.scopusid2-s2.0-85006266093-
dc.type.rimsART-
dc.citation.volume16-
dc.citation.issue12-
dc.citation.beginningpage7402-
dc.citation.endingpage7407-
dc.citation.publicationnameNANO LETTERS-
dc.identifier.doi10.1021/acs.nanolett.6b02939-
dc.contributor.localauthorKang, Seung-Kyun-
dc.contributor.nonIdAuthorKrueger, Neil A.-
dc.contributor.nonIdAuthorHolsteen, Aaron L.-
dc.contributor.nonIdAuthorOcier, Christian R.-
dc.contributor.nonIdAuthorZhou, Weijun-
dc.contributor.nonIdAuthorMensing, Glennys-
dc.contributor.nonIdAuthorRogers, John A.-
dc.contributor.nonIdAuthorBrongersma, Mark L.-
dc.contributor.nonIdAuthorBraun, Paul V.-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorMicrolenses-
dc.subject.keywordAuthortransformation optics-
dc.subject.keywordAuthorsilicon photonics-
dc.subject.keywordAuthorbirefringence-
dc.subject.keywordPlusLUNEBURG LENS-
dc.subject.keywordPlusTRANSFORMATION OPTICS-
dc.subject.keywordPlusSUPERLATTICES-
dc.subject.keywordPlusDIELECTRICS-
dc.subject.keywordPlusLIGHT-
dc.subject.keywordPlusCLOAK-
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