Photon-assisted tunneling for sub-bandgap light detection in silicon PN-doped waveguides

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dc.contributor.authorYou, Jong-Bumko
dc.contributor.authorKwon, Hyeokbinko
dc.contributor.authorKim, Jonghoonko
dc.contributor.authorPark, Hyo-Hoonko
dc.contributor.authorYu, Kyoungsikko
dc.date.accessioned2017-05-08T08:49:40Z-
dc.date.available2017-05-08T08:49:40Z-
dc.date.created2017-04-18-
dc.date.created2017-04-18-
dc.date.issued2017-02-
dc.identifier.citationOPTICS EXPRESS, v.25, no.4, pp.4284 - 4296-
dc.identifier.issn1094-4087-
dc.identifier.urihttp://hdl.handle.net/10203/223546-
dc.description.abstractWe demonstrate silicon ridge waveguide photo-detectors capable of sub-bandgap light absorption and avalanche multiplication. The proposed waveguide photo-detectors contain highly doped PN junction, where a strong electric field can generate the photon-assisted tunneling current for sub-bandgap light incidence and amplify the generated photocurrent by the avalanche multiplication effect. The voltage-dependent sub-bandgap absorption coefficient and multiplication gain are experimentally evaluated for various doping configurations to find optimal photo-response with low dark currents. As a result, our representative silicon waveguide photo-detector gives sub-bandgap responsivities of similar to 10 and similar to 2 A/W under the applied reverse bias voltage of -8.3 V for near-infrared wavelengths of 1.31 and 1.52 mu m, respectively. The voltage-dependent frequency photo-response is also demonstrated with theoretical verification. (C) 2017 Optical Society of America-
dc.languageEnglish-
dc.publisherOPTICAL SOC AMER-
dc.subjectALL-SILICON-
dc.subjectINFRARED PHOTODIODES-
dc.subjectINTRINSIC SILICON-
dc.subjectEMITTING-DIODES-
dc.subject300 K-
dc.subjectPHOTODETECTORS-
dc.subjectTEMPERATURE-
dc.titlePhoton-assisted tunneling for sub-bandgap light detection in silicon PN-doped waveguides-
dc.typeArticle-
dc.identifier.wosid000397317400125-
dc.identifier.scopusid2-s2.0-85013466493-
dc.type.rimsART-
dc.citation.volume25-
dc.citation.issue4-
dc.citation.beginningpage4284-
dc.citation.endingpage4296-
dc.citation.publicationnameOPTICS EXPRESS-
dc.identifier.doi10.1364/OE.25.004284-
dc.contributor.localauthorPark, Hyo-Hoon-
dc.contributor.localauthorYu, Kyoungsik-
dc.contributor.nonIdAuthorKwon, Hyeokbin-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusALL-SILICON-
dc.subject.keywordPlusINFRARED PHOTODIODES-
dc.subject.keywordPlusINTRINSIC SILICON-
dc.subject.keywordPlusEMITTING-DIODES-
dc.subject.keywordPlus300 K-
dc.subject.keywordPlusPHOTODETECTORS-
dc.subject.keywordPlusTEMPERATURE-
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