Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy
- Publisher
- CAMBRIDGE UNIV PRESS
- Issue Date
- 2013-08
- Language
- English
- Citation
MICROSCOPY AND MICROANALYSIS, v.19, no.S2, pp.1226 - 1227
- ISSN
- 1431-9276
- Appears in Collection
- MS-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
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