Very Wide Dynamic Range ROIC With Pixel-Level ADC for SWIR FPAs

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This paper describes a new wide dynamic range readout circuit incorporating a pixel-level time-to-digital analogto- digital converter for a short-wavelength infrared InGaAs focal plane array. To extend the dynamic range, the self-controlled integration capacitance technique and the detector current adaptive integration time technique are adopted in the readout circuit, which is operated individually in each pixel. Each pixel can have an appropriate gain independently depending on the signal current without any help from a digital processor. The readout circuit was fabricated using a 0.35-mu m standard CMOS process. The measured results of the fabricated chip show that the dynamic range exceeds 140 dB and that the noise level is 73.35 e-rms
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2016-10
Language
English
Article Type
Article
Keywords

CMOS IMAGE SENSOR; LWIR FPAS

Citation

IEEE SENSORS JOURNAL, v.16, no.19, pp.7227 - 7233

ISSN
1530-437X
DOI
10.1109/JSEN.2016.2599181
URI
http://hdl.handle.net/10203/213851
Appears in Collection
EE-Journal Papers(저널논문)
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